Contract Details
Title

Scanning Electron Microscope China

Country
Language
English
Organization
Published Date
10.07.2024
Awarded Date
17.09.2019
Overview
Contract Award's Details : Scanning Electron Microscope Ceiec Country: China Scanning Electron Microscope Contract Awarded for Scanning electron microscope Project Name: Construction project of special process production line of gta semiconductor co.,ltd Purchasers: Gtasemiconductorco., Ltd Open-Time of Bids: :2019-08-30 10:00 Data of Evaluation Result: :20190905 22:32 20190909 23:59 Data of Bidding Result: :2019-09-18 00:18 China Contract value : See in details Contractors : BOYIN TECHNOLOGY PTE LTD See in details 18/09/2019 18/12/2019 12668253 18/09/2019 Ceiec Country: China Address : China China Contract Awards China 0714-1840SHJT0001/35 See in details 18/12/2019 See in details
NAICS
Construction Agriculture Construction Process
CPVS
Scanning electron microscopes Construction, foundation and surface works for highways, roads Wells construction work Construction work Semiconductors Goods used in construction Architectural, construction, engineering and inspection services
UNSPSC
Awards Electron microscopes
Regions
APEC Countries Asia Eastern Asia
Sectors
Civil Works Automobiles and Auto Parts Supply Construction Energy-Power and Electrical Computer Hardwares and Consumables
Contractor
Contract Value
See in details
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