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Contract Details
| Title |
Epitaxial Wafer Surface Defect Tester, Carrier Concentration Test System, Mocvd Epitaxial Measurement Equipment Photoluminescence (pl) Of The 1 Set China |
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| Country | ||||
| Language | English | |||
| Organization | ||||
| Published Date | 09.07.2024 | |||
| Awarded Date | 04.01.2018 | |||
| Overview | Contract Award's Details : Epitaxial Wafer Surface Defect Tester, Carrier Concentration Test System, Mocvd Epitaxial Measurement Equipment Photoluminescence (pl) Of The 1 Set Northwest International Tendering Corp. Country: China Epitaxial Wafer Surface Defect Tester, Carrier Concentration Test System, Mocvd Epitaxial Measurement Equipment Photoluminescence (pl) Of The 1 Set Contract Awarded for Epitaxial wafer surface defect tester, Carrier concentration test system, Mocvd epitaxial measurement equipment photoluminescence (pl) of the 1 set Project Name: Shaanxi institute of optoelectronic integrated circuits pilot institute of technology co., Ltd. Equipment procurement Purchasers: Xiandaojishuyanjiuyuan Open-Time of Bids: :2017-12-26 09:30 Data of Evaluation Result: :20171228 13:42 20180102 23:59 Data of Bidding Result: :2018-01-05 15:05 China Contract value : See in details Contractors : CHARMING TRADING LIMITED See in details 05/01/2018 05/04/2018 10447519 05/01/2018 Northwest International Tendering Corp. Country: China Address : China China Contract Awards China 0617-174022HY2332/01 See in details 05/04/2018 See in details | |||
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| UNSPSC |
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China
| Title |
|---|
Epitaxial Wafer Surface Defect Tester, Carrier Concentration Test System, Mocvd Epitaxial Measurement Equipment Photoluminescence (pl) Of The 1 Set China |
| Country |
| Language |
| English |
| Organization |
| Published Date |
| 09.07.2024 |
| Awarded Date |
| 04.01.2018 |
| Overview |
| Contract Award's Details : Epitaxial Wafer Surface Defect Tester, Carrier Concentration Test System, Mocvd Epitaxial Measurement Equipment Photoluminescence (pl) Of The 1 Set Northwest International Tendering Corp. Country: China Epitaxial Wafer Surface Defect Tester, Carrier Concentration Test System, Mocvd Epitaxial Measurement Equipment Photoluminescence (pl) Of The 1 Set Contract Awarded for Epitaxial wafer surface defect tester, Carrier concentration test system, Mocvd epitaxial measurement equipment photoluminescence (pl) of the 1 set Project Name: Shaanxi institute of optoelectronic integrated circuits pilot institute of technology co., Ltd. Equipment procurement Purchasers: Xiandaojishuyanjiuyuan Open-Time of Bids: :2017-12-26 09:30 Data of Evaluation Result: :20171228 13:42 20180102 23:59 Data of Bidding Result: :2018-01-05 15:05 China Contract value : See in details Contractors : CHARMING TRADING LIMITED See in details 05/01/2018 05/04/2018 10447519 05/01/2018 Northwest International Tendering Corp. Country: China Address : China China Contract Awards China 0617-174022HY2332/01 See in details 05/04/2018 See in details |
| NAICS |
| Machinery International |
| CPVS |
| System, storage and content management software package System, storage and content management software development services |
| UNSPSC |
| - |
| Regions |
| APEC Countries Asia Eastern Asia |
| Sectors |
| Automobiles and Auto Parts Supply Printing and Publishing Technology Hardware and Equipment Construction Energy-Power and Electrical Computer Hardwares and Consumables Electronics |
| Contractor |
| Contract Value |
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