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Total 3
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Tender ID | Title | Country | Awarded Date | |
---|---|---|---|---|
Package 3 Photoluminescence Instrument (pl) China *****
Organization:
*****
Language:
English
|
China
|
23.10.2018 | ||
Automatic Pl Measurement System China *****
Organization:
*****
Language:
English
|
China
|
10.05.2018 | ||
Epitaxial Wafer Surface Defect Tester, Carrier Con... *****
Organization:
*****
Language:
English
|
China
|
04.01.2018 |
Epitaxial Wafer Surface Defect Tester, Carrier Concentration Test System, Mocvd Epitaxial Measuremen...
Organization:
*****
Language:
English
Country:
China
Deadline:
04.01.2018