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Total 3
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Tender ID | Title | Country | Awarded Date | |
---|---|---|---|---|
Procurement Of 14nm Sram And Device Characterizati... *****
Organization:
*****
Language:
English
|
China
|
11.07.2020 | ||
14nm Logic Feol And Sram Yield Analysis Project Ch... *****
Organization:
*****
Language:
English
|
China
|
16.09.2019 | ||
28nm Addressable Test Chip Design And Evaluation C... *****
Organization:
*****
Language:
English
|
China
|
21.01.2018 |
Procurement Of 14nm Sram And Device Characterization Test Circuit And Yield Improvement Project Chin...
Organization:
*****
Language:
English
Country:
China
Deadline:
11.07.2020