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Micro Analysis System (extension) for Scanning Electron Microscope (SEM) Switzerland
Organization:
*****
Language:
English
Country:
Switzerland
Deadline:
08.01.2016
Research infrastructures and instrumentation for the construction of the Centre for quality testing...
Organization:
*****
Language:
English
Country:
Slovakia
Deadline:
07.01.2016
Provision of a Field Emission Scanning Electron Microscope with energy dispersive X-ray spectrometer...
Organization:
*****
Language:
English
Country:
United Kingdom
Deadline:
18.12.2015
Laboratory, optical and precision equipments (excl. glasses) United Kingdom
Organization:
*****
Language:
English
Country:
United Kingdom
Deadline:
08.12.2015
Supply, Delivery, and Commissioning of a Scanning Electron Microscope (SEM) Unit United Kingdom
Organization:
*****
Language:
English
Country:
United Kingdom
Deadline:
03.12.2015
RC-401 BP - Assens - Construction of a roundabout and renovation of a bridge - Civil Works Switzerla...
Organization:
*****
Language:
English
Country:
Switzerland
Deadline:
30.11.2015
Instrument FIB / SEM according to documents Combined Focused Ion Beam Milling and Scanning Electron...
Organization:
*****
Language:
English
Country:
Switzerland
Deadline:
30.11.2015
FIB/SEM device, according to the enclosed documents Combined Focused Ion Beam Milling and Scanning E...
Organization:
*****
Language:
English
Country:
Switzerland
Deadline:
30.11.2015
FIB / SEM instrument, according beileigender documents Combined Focused Ion Beam Milling and Scannin...
Organization:
*****
Language:
English
Country:
Switzerland
Deadline:
30.11.2015
Additional support services in connection with the introduction of an integral data management solut...
Organization:
*****
Language:
English
Country:
Switzerland
Deadline:
30.11.2015
The present tender is the conversion of the tunnels, all Maroggia, Property no 550, within the 4m co...
Organization:
*****
Language:
English
Country:
Switzerland
Deadline:
04.11.2015