Project News Details
Title
On the trail of a cause for solar cell LID
Detail
Scientists in the United States used sophisticated imaging to delve deep into the structure of a silicon solar cell, revealing for the first time a distinct defect signature for light-induced degradation. Their technique could be used to better understand the mechanisms behind multiple various defects affecting the performance of silicon and other solar cell technologies.
Country
International
Source
PV-Magazine
Regions
Africa Asia Australia Europe North America Oceania South America
Sectors
Non-Renewable Energy Solar Photovoltaic PV Energy Railways-Rail-Railroad Construction Energy-Power and Electrical Computer Hardwares and Consumables Petroleum Products
Published Date
14.10.2021
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