Project News Details
Title
New tech to reduce oxygen defects in Czochralski wafers
Detail
Research from the Chin-Yi University of Technology in Taiwan revealed a novel heater design in the Czochralski silicon crystal growth process that can control and decrease oxygen concentration without incurring the costs associated with other methods, such as installing magnets or using alternative crucible materials.
Country
International
Source
PV-Magazine
Regions
Africa Asia Australia Europe North America Oceania South America
Sectors
Construction Energy-Power and Electrical Computer Hardwares and Consumables
Published Date
29.12.2024
Original Url
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