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| Language | English |
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| Overview |
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| CPVS | |
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| Title |
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Focused Ion Beam Electron Microscope (Fib-Sem) Tender Notice... *****
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| Language |
| English |
| Organization |
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| Published Date |
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| Deadline Date |
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| Overview |
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| NAICS |
| Justice Mining Justice Automotive Parts Construction Other Justice Colleges Colleges International Colleges Other Justice Construction |
| CPVS |
| Wheels, parts and accessories Mining, basic metals and related products Electron microscopes Beams Postal orders |
| UNSPSC |
| Beams Software Electron microscopes IP phones University Direction Finding Equipment, Accessories Humanitarian Relief Items, Kits, or Accessories |
| Regions |
| Europe |
| Sectors |
| Postal and Courier Services Printing and Publishing Construction Energy-Power and Electrical Computer Hardwares and Consumables Steel Marine |
| URL |
| Share |
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