Tender Details
Title

Scanning Electron and Focussed Ion Beam Microscope (Fib-Sem)... ***** *****

Country
***** Content Locked
Language
English
Organization
***** Content Locked
Published Date
***** Content Locked
Deadline Date
***** Content Locked
Overview
***** Content Locked ***** Content Locked
NAICS
International
CPVS
Scanning electron microscopes Gallium Iridium, gallium, indium, thallium and barium Microscopes Beams Postal orders
UNSPSC
Beams Electron microscopes IP phones Clinical laboratory and toxicology testing systems, components, and supplies Clinical laboratory and toxicology testing systems, components, and supplies
Regions
Europe Western Europe
Sectors
Postal and Courier Services Roads and Highways-Bridge Printing and Publishing Construction Energy-Power and Electrical Computer Hardwares and Consumables Steel
URL
***** Content Locked
Share

The companies bidding for this tender

No Offers Available
To be notified
when a tender matching your filter is published
To Follow
Tenders
Add New Tender Alert
To Follow
Contracts
Add New Contract Alert
To Follow
Fairs
Add New Fair Alert
Similar Tenders
***** Content Locked
Language: English
Deadline Date: 29.11.2024
***** Content Locked
Language: English
Deadline Date: 27.11.2024
***** Content Locked
Language: English
Deadline Date: 29.11.2024
***** Content Locked
Language: English
Deadline Date: 05.11.2024
***** Content Locked
Language: English
Deadline Date: 09.12.2024
***** Content Locked
Language: English
Deadline Date: 25.11.2024
***** Content Locked
Language: English
Deadline Date: 22.11.2024
***** Content Locked
Language: English
Deadline Date: 14.11.2024
***** Content Locked
Language: English
Deadline Date: 20.11.2024
***** Content Locked
Language: English
Deadline Date: 25.04.2025
***** Content Locked
Language: English
Deadline Date: 28.11.2024
***** Content Locked
Language: English
Deadline Date: 21.11.2024