Tender Details

Title	Microscope Components Tender Notice International Competitive Bidding
Country	United States of America
Language	English
Organization	COMMERCE, DEPARTMENT OF
Published Date	28.06.2024
Deadline Date	12.07.2024
Overview	Microscope Components Description Advanced semiconductor technology has led to continuous performance improvements in transistors. However, many iterations are needed to obtain optimal performance and the yield and reproducibility is incredibly poor. Furthermore, US chip makers are ill-equipped with legacy measurement techniques and underperforming models. We propose a robust path to develop and verify high-frequency transistor models: 1) new on-wafer standards and calibration, 2) precision noise measurements for transistor quality assurance, 3) improved characterizations, 4) optimal models tailored to a given technology, and 5) transistor model verification across frequency with key performance indicators. The National Institute of Standards and Technology (NIST) Radio Frequency (RF) technology division is seeking inspection microscope components to build custom manual probe stations dedicated to the characterization of active devices and circuits above 100 GHz. The solution must include 4k cameras, objective lenses of several magnifications, and manual Z focus blocks. This solution will enable transistor large-signal characterization that will be used to extract and validate transistor models under the CHIPS program. See attachment for complete notice details COMMERCE, DEPARTMENT OF Contracting Office Address : KANSAS CITY , MO 64106 Primary Point of Contact : BEVERLY J PARKER BEVERLY.J.PARKER@NOAA.GOV Phone Number 5418678730 Fax Number 5418678864 joni.laster@nist.gov Tender Notice International Competitive Bidding 1333ND24QNB030371 United States of America GT-103351406
NAICS	Copper International Copper
CPVS	Iron, lead, zinc, tin and copper Probes Transistors Lead Office, school and office equipment cleaning services Blocks Semiconductors Cameras Microscopes Keys Vegetable saps, extracts, peptic substances and thickeners Radio, television, communication, telecommunication and related equipment Manuals Tools, locks, keys, hinges, fasteners, chain and springs
UNSPSC	Blocks Cameras Still cameras Radios Inspection Two way radios IP phones Tent, for office use Suction pump, manual Clinical laboratory and toxicology testing systems, components, and supplies Clinical laboratory and toxicology testing systems, components, and supplies
Regions	APEC Countries North America Northern America
Sectors	Building Automobiles and Auto Parts Postal and Courier Services Printing and Publishing Defence and Security Technology Hardware and Equipment Construction Energy-Power and Electrical Computer Hardwares and Consumables Building Material Marine
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Title
Microscope Components Tender Notice International Competitive Bidding
Country
United States of America
Language
English
Organization
COMMERCE, DEPARTMENT OF
Published Date
28.06.2024
Deadline Date
12.07.2024
Overview
Microscope Components Description Advanced semiconductor technology has led to continuous performance improvements in transistors. However, many iterations are needed to obtain optimal performance and the yield and reproducibility is incredibly poor. Furthermore, US chip makers are ill-equipped with legacy measurement techniques and underperforming models. We propose a robust path to develop and verify high-frequency transistor models: 1) new on-wafer standards and calibration, 2) precision noise measurements for transistor quality assurance, 3) improved characterizations, 4) optimal models tailored to a given technology, and 5) transistor model verification across frequency with key performance indicators. The National Institute of Standards and Technology (NIST) Radio Frequency (RF) technology division is seeking inspection microscope components to build custom manual probe stations dedicated to the characterization of active devices and circuits above 100 GHz. The solution must include 4k cameras, objective lenses of several magnifications, and manual Z focus blocks. This solution will enable transistor large-signal characterization that will be used to extract and validate transistor models under the CHIPS program. See attachment for complete notice details COMMERCE, DEPARTMENT OF Contracting Office Address : KANSAS CITY , MO 64106 Primary Point of Contact : BEVERLY J PARKER BEVERLY.J.PARKER@NOAA.GOV Phone Number 5418678730 Fax Number 5418678864 joni.laster@nist.gov Tender Notice International Competitive Bidding 1333ND24QNB030371 United States of America GT-103351406
NAICS
Copper International Copper
CPVS
Iron, lead, zinc, tin and copper Probes Transistors Lead Office, school and office equipment cleaning services Blocks Semiconductors Cameras Microscopes Keys Vegetable saps, extracts, peptic substances and thickeners Radio, television, communication, telecommunication and related equipment Manuals Tools, locks, keys, hinges, fasteners, chain and springs
UNSPSC
Blocks Cameras Still cameras Radios Inspection Two way radios IP phones Tent, for office use Suction pump, manual Clinical laboratory and toxicology testing systems, components, and supplies Clinical laboratory and toxicology testing systems, components, and supplies
Regions
APEC Countries North America Northern America
Sectors
Building Automobiles and Auto Parts Postal and Courier Services Printing and Publishing Defence and Security Technology Hardware and Equipment Construction Energy-Power and Electrical Computer Hardwares and Consumables Building Material Marine
URL
Download Document
Share